Semiconductor devices having fin-shaped active regions

ABSTRACT

Semiconductor devices are provided. A semiconductor device includes a substrate including a device region defined by a trench in the substrate. The semiconductor device includes a plurality of fin-shaped active regions spaced apart from each other in the device region and extending in a first direction. The semiconductor device includes a protruding pattern extending along a bottom surface of the trench. Moreover, an interval between the protruding pattern and the plurality of fin-shaped active regions is greater than an interval between two adjacent ones of the plurality of fin-shaped active regions.

CROSS-REFERENCE TO RELATED APPLICATION

This application claims the benefit of Korean Patent Application No.10-2017-0118837, filed on Sep. 15, 2017, in the Korean IntellectualProperty Office, the disclosure of which is hereby incorporated hereinin its entirety by reference.

BACKGROUND

The present disclosure relates to semiconductor devices. With the rapidspread of information media in recent years, functions of semiconductordevices have been dramatically developed. In order to securecompetitiveness and to achieve high integration of products with lowcost and high quality, scaling down of the semiconductor devices hasbeen performed.

To scale down semiconductor devices, a transistor has been developed inwhich a fin-shaped active region protruding from a substrate is formedand then a gate electrode is formed on the fin-shaped active region. Thetransistor formed in the fin-shaped active region may have improvedcurrent control capability and may not suffer from a short channeleffect (SCE).

SUMMARY

The present inventive concepts provide a highly integrated semiconductordevice having a fin-shaped active region.

According to example embodiments of the present inventive concepts, asemiconductor device may include a substrate including a device regiondefined by a trench in the substrate. The semiconductor device mayinclude a plurality of fin-shaped active regions spaced apart from eachother in the device region and extending in a first direction. Moreover,the semiconductor device may include a plurality of protruding patternsextending along a bottom surface of the trench. One of the plurality ofprotruding patterns may extend from a lower end of a sidewall of thedevice region. Adjacent ones of the plurality of fin-shaped activeregions may be spaced apart from each other at a first pitch in a seconddirection perpendicular to the first direction. The plurality ofprotruding patterns and the plurality of fin-shaped active regions maybe spaced apart from each other at a second pitch in the seconddirection, and the second pitch may be greater than the first pitch.

A semiconductor device, according to example embodiments of the presentinventive concepts, may include a substrate including a device regiondefined by a trench in the substrate. The semiconductor device mayinclude a plurality of fin-shaped active regions spaced apart from eachother in the device region and extending in a first direction. Thesemiconductor device may include a plurality of protruding patternsextending along a bottom surface of the trench. Moreover, an intervalbetween the plurality of protruding patterns and the plurality offin-shaped active regions may be greater than an interval between twoadjacent ones of the plurality of fin-shaped active regions.

A semiconductor device, according to example embodiments of the presentinventive concepts, may include a substrate including a device regiondefined by a trench in the substrate. The semiconductor device mayinclude a plurality of fin-shaped active regions spaced apart from eachother at a first pitch in the device region and extending in a firstdirection. The semiconductor device may include a protruding patternextending along a bottom surface of the trench from a lower end of asidewall of the device region. The semiconductor device may include anisolation layer on lower portions of sidewalls of the plurality offin-shaped active regions, on the sidewall of the device region, and onthe protruding pattern. Moreover, the semiconductor device may include aplurality of gate structures spaced apart from each other and extendingin a second direction on the isolation layer and on the plurality offin-shaped active regions. Each of the plurality of gate structures mayinclude a gate dielectric film and a gate conductive layer intersectingthe plurality of fin-shaped active regions. The protruding pattern andthe plurality of fin-shaped active regions may be spaced apart from eachother at a second pitch greater than the first pitch in the seconddirection.

BRIEF DESCRIPTION OF THE DRAWINGS

Example embodiments of the present inventive concepts will be moreclearly understood from the following detailed description taken inconjunction with the accompanying drawings in which:

FIGS. 1A, 1B, 1C, 1D, 2A, 2B, 2C, 2D, 3A, 3B, 3C, 3D, 4A, 4B, 4C, 4D,5A, 5B, 5C, and 5D illustrate views of a method of manufacturing (e.g.,forming) a semiconductor device, according to some example embodimentsof the present inventive concepts. In particular, FIG. 1A is a planview, and FIGS. 1B to 1D are cross-sectional views, illustrating amethod of manufacturing a semiconductor device, according to someexample embodiments of the present inventive concepts;

FIG. 2A is a plan view, and FIGS. 2B to 2D are cross-sectional views,illustrating a method of manufacturing a semiconductor device, accordingto some example embodiments of the present inventive concepts;

FIG. 3A is a plan view, and FIGS. 3B to 3D are cross-sectional views,illustrating a method of manufacturing a semiconductor device, accordingto some example embodiments of the present inventive concepts;

FIG. 4A is a plan view, and FIGS. 4B to 4D are cross-sectional views,illustrating a method of manufacturing a semiconductor device, accordingto some example embodiments of the present inventive concepts;

FIG. 5A is a plan view, and FIGS. 5B to 5D are cross-sectional views,illustrating a method of manufacturing a semiconductor device, accordingto some example embodiments of the present inventive concepts; and

FIG. 6A is a plan view, and FIGS. 6B to 6D are cross-sectional views, ofa configuration of a semiconductor device, according to some exampleembodiments of the present inventive concepts.

DETAILED DESCRIPTION

FIGS. 1A to 1D are a plan view and cross-sectional views illustrating amethod of manufacturing a semiconductor device, according to someexample embodiments of the present inventive concepts. In more detail,FIG. 1A is a plan view and FIGS. 1B, 1C, and 1D are respectivecross-sectional views taken along line B-B′, line C-C′, and line D-D′ ofFIG. 1A.

Referring to FIGS. 1A to 1D, a plurality of first mask patterns M1 areformed on a substrate 110 having a device region RX. The device regionRX may be an upper portion of the substrate 110.

The substrate 110 may include a semiconductor material. The substrate110 may include at least one of a group III-V material and a group IVmaterial. The substrate 110 may include, for example, silicon (Si).Alternatively, the substrate 110 may include a semiconductor elementsuch as germanium (Ge), or a compound semiconductor material such assilicon germanium (SiGe), silicon carbide (SiC), gallium arsenide(GaAs), indium arsenide (InAs), and indium phosphide (InP). The groupIII-V material may include a binary, a trinary, or a quaternary compoundincluding at least one group III element and at least one group Velement. The group III-V material may be a compound including at leastone element of indium (In), gallium (Ga), and aluminum (Al), as thegroup III element, and at least one element of arsenic (As), phosphorus(P), and antimony (Sb), as the group V element. For example, the groupIII-V material may be selected from InP, In_(z)Ga_(1-z)As (0≤z≤1), andAl_(z)Ga_(1-z)As (0≤z≤1). The binary compound may be one of, forexample, InP, GaAs, InAs, InSb and GaSb. The trinary compound may be oneof InGaP, InGaAs, AlInAs, InGaSb, GaAsSb and GaAsP. The group IVmaterial may be Si or Ge. However, example embodiments of the presentinventive concepts are not limited to the above examples of the groupIII-V material and the group IV material usable in a semiconductordevice. The group III-V material and the group IV material such as Gemay be used as channel materials for forming a transistor having lowpower consumption and a high operating speed. A high performance CMOSdevice may be fabricated by using a semiconductor substrate includingthe group III-V material, e.g., GaAs, having a higher electron mobilitythan that of an Si substrate, and a semiconductor substrate having asemiconductor material, e.g., Ge, having a higher hole mobility thanthat of the Si substrate. In some example embodiments, when an n-channelmetal-oxide-semiconductor (NMOS) transistor is formed on the substrate110, the substrate 110 may include one of the group III-V materialsexplained above. In some example embodiments, when a p-channelmetal-oxide-semiconductor (PMOS) transistor is formed on the substrate110, at least a part of the substrate 110 may include Ge. In someexample embodiments, the substrate 110 may have a silicon-on-insulator(SOI) structure or a germanium-on-insulator (GOI) structure. Forexample, the substrate 110 may include a buried oxide (BOX) layer. Thesubstrate 110 may include a conductive area, for example, a well dopedwith impurities.

The plurality of first mask patterns M1 are substantially spaced apartfrom each other in a first direction (X direction) and may extendprimarily/substantially (i.e., a longest distance) in a second direction(Y direction). The fact that the plurality of first mask patterns M1extend substantially in the second direction (Y direction) means thatthe plurality of first mask patterns M1 extend mostly/entirely in thesecond direction (Y direction), but at least some of the plurality offirst mask patterns M1 may extend partially in a direction differentfrom the second direction (Y direction).

At least some of the plurality of first mask patterns M1 may haveportions extending in a direction different from the second direction (Ydirection). In the specification, the phrase “first mask patterns M1extending in the second direction (Y direction)” may mean that all ofthe plurality of first mask patterns M1 extend in the second direction(Y direction) without some of them extending in a direction differentfrom the second direction. In the specification, curved mask patterns M1a and M1 b have a portion extending in a direction different from thesecond direction (Y direction) in the plurality of first mask patternsM1. In particular, the curved mask patterns M1 a and M1 b may changedirections. The curved mask patterns M1 a and M1 b may include a firstcurved mask pattern M1 a and a second curved mask pattern M1 b.

The first curved mask pattern M1 a may include a first main extensionunit/portion MMa1, a second main extension unit/portion MMa2, a maskbypass extension unit/portion MDa, and first mask refractionunits/portions MBa. The first main extension unit/portion MMa1, one ofthe first mask refraction units/portions MBa, the mask bypass extensionunit/portion MDa, the other (a second) one of the first mask refractionunits/portions MBa, and the second main extension unit/portion MMa2 maybe sequentially connected to provide the first curved mask pattern M1 aand may extend substantially in the second direction (Y direction).

The first main extension unit/portion MMa1, the second main extensionunit/portion MMa2, and the mask bypass extension unit/portion MDa mayall extend primarily in the second direction (Y direction) and may bespaced apart from each other. The first main extension unit/portion MMa1and the second main extension unit/portion MMa2 are located on onestraight line extending in the second direction (Y direction) and may bespaced apart from each other. As the first main extension unit/portionMMa1 and the second main extension unit/portion MMa2 are located on thesame straight line, they may be referred to herein as being “collinear.”

The mask bypass extension MDa may be on another (a second) straight linewhich is spaced apart from the one straight line and extends in thesecond direction, the one straight line extending in the seconddirection (Y direction) and the first main extension unit/portion MMa1and the second main extension unit/portion MMa2 being located on the onestraight line.

The first mask refraction units/portions MBa are located between thefirst main extension unit/portion MMa1 and the mask bypass extensionunit/portion MDa and between the second main extension unit/portion MMa2and the mask bypass extension unit/portion MDa, and may connect thefirst main extension unit/portion MMa1 and the mask bypass extensionunit/portion MDa, and the second main extension unit/portion MMa2 andthe mask bypass extension unit/portion MDa, respectively.

The first mask refraction units/portions MBa may extend primarily in adirection different from the second direction (Y direction). The firstmask refraction units/portions MBa may extend, e.g., in an obliquedirection with respect to each of the first direction (X direction) andthe second direction (Y direction) as shown in FIG. 1A, but are notlimited thereto. In some example embodiments, the first mask refractionunits/portions MBa may extend in the first direction (X direction). Insome example embodiments, the first mask refraction units/portions MBamay have an S shape.

The second curved mask pattern M1 b may include a third main extensionunit/portion MMb1, a fourth main extension unit/portion MMb2, and asecond mask refraction unit/portion MBb. The third main extensionunit/portion MMb1, the second mask refraction unit/portion MBb, and thefourth main extension unit/portion MMb2 may be sequentially connected toprovide the second curved mask pattern M1 b and may extend substantiallyin the second direction (Y direction).

The third main extension unit/portion MMb1 and the fourth main extensionunit/portion MMb2 may each extend in the second direction (Y direction),and may be spaced apart from each other. The third main extensionunit/portion MMb1 and the fourth main extension unit/portion MMb2 arelocated on respective straight lines extending in the second direction(Y direction) and spaced apart from each other, wherein the third mainextension unit/portion MMb1 and the fourth main extension unit/portionMMb2 may be spaced apart from each other.

The second mask refraction unit/portion MBb is located between the thirdmain extension unit/portion MMb1 and the fourth main extensionunit/portion MMb2 and may connect the same.

The second mask refraction unit/portion MBb may extend in a directiondifferent from the second direction (Y direction). The second maskrefraction unit/portion MBb may extend, e.g., in an oblique directionwith respect to each of the first direction (X direction) and the seconddirection (Y direction) as shown in FIG. 1A, but is not limited thereto.In some example embodiments, the second mask refraction unit/portion MBbmay extend in the first direction (X direction). In some exampleembodiments, the second mask refraction unit/portion MBb may have an Sshape.

In some example embodiments, the second curved mask pattern M1 b may bea portion of the first curved mask pattern M1 a. That is, the third mainextension unit/portion MMb1, the fourth main extension unit/portionMMb2, and the second mask refraction unit/portion MBb of the secondcurved mask pattern M1 b may correspond to the first main extensionunit/portion MMa1, the mask bypass extension unit/portion MDa, and thefirst mask refraction units/portions MBa connecting the first mainextension unit/portion MMa1 and the mask bypass extension unit/portionMDa of the first curved mask pattern M1 a, respectively.

Furthermore, FIG. 1A shows that the first curved mask pattern M1 a hastwo of the main extension units/portions MMa1 and MMa2, one of the maskbypass extension units/portion MDa, and two of the mask refractionunits/portions MBa, but is not limited thereto. The first curved maskpattern M1 a may have three or more main extension units/portions, andtwo or more mask bypass extension units/portions, and may further havethree or more mask refraction units/portions for connecting the mainextension units/portions and the mask bypass extension units/portions.

Similarly, FIG. 1A shows that the second curved mask pattern M1 b hastwo of the main extension units/portions MMb1 and MMb2, and one of themask refraction unit/portion MBb, but is not limited thereto. The secondcurved mask pattern M1 b may have three or more main extensionunits/portions, and one or more mask bypass extension units/portions,and may further have three or more mask refraction units/portions forconnecting the main extension units/portions and the mask bypassextension units/portions.

The plurality of first mask patterns M1 may be spaced apart from eachother by a first pitch PiN or a second pitch PiW and may extend in adirection. In the specification, a pitch refers to an interval of thefirst mask patterns M1, or structures being spaced apart from each otherand extending in a direction, such as a fin-shaped active region and aprotruding pattern described later below, and in more detail, a distancebetween centers of the two structures spaced apart and extending fromeach other in a width direction.

The second pitch PiW may have a value larger than the first pitch PiN.In some example embodiments, the second pitch PiW may be 1.5 times thefirst pitch PiN, but is not limited thereto.

A difference between the second pitch PiW and the first pitch PiN may bean interval/distance between one straight line (e.g., an axis) extendingin the second direction (Y direction) and at which the first mainextension unit/portion MMa1 and the second main extension unit/portionMMa2 are located (e.g., at respective midpoints of the units/portionsMMa1 and MMa2) and another straight line (e.g., another axis) extendingin the second direction (Y direction) and at which the mask bypassextension unit/portion MDa is located. In some example embodiments, theinterval/distance between one straight line extending in the seconddirection (Y direction) and at which the first main extensionunit/portion MMa1 and the second main extension unit/portion MMa2 arelocated and the other straight line extending in the second direction (Ydirection) and at which the mask bypass extension unit/portion MDa islocated may be 0.5 times the first pitch PiN.

The difference between the second pitch PiW and the first pitch PiN maybe an interval/distance between straight lines extending in the seconddirection (Y direction) and at which the third main extensionunit/portion MMb1 and the fourth main extension unit/portion MMb2 arelocated, respectively. In some example embodiments, theinterval/distance between straight lines extending in the seconddirection (Y direction) and at which the third main extensionunit/portion MMb1 and the fourth main extension unit/portion MMb2 arelocated, respectively, may be 0.5 times the first pitch PiN.

As will be described later below in detail in FIGS. 3A to 3D, portionsof the first mask pattern M1 corresponding to a remaining portion and aremoved portion after performing a subsequent process from amongstructures (preliminary fin-shaped active regions PFA in FIGS. 2A to2D), which are formed by performing an etching process using the firstmask pattern M1 as an etching mask, may be spaced apart from each otherwith the second pitch PiW. In addition, portions of the first maskpattern M1 corresponding to two remaining portions or two removedportions after performing the subsequent process from among thestructures (preliminary fin-shaped active regions PFA in FIGS. 2A to2D), which are formed by performing the etching process using the firstmask pattern M1 as an etching mask, may be spaced apart from each otherwith the first pitch PiN.

The first mask pattern M1 may include a silicon nitride layer, a siliconoxynitride layer, a spin-on glass (SOG) layer, a spin-on hardmask (SOH)layer, a photoresist layer, or a combination thereof, but is not limitedthereto.

In some example embodiments, the first mask pattern M1 may be formed byan extreme ultraviolet lithography (EUV) process.

FIGS. 2A to 2D are a plan view and cross-sectional views illustrating amethod of manufacturing a semiconductor device, according to someexample embodiments of the present inventive concepts. In more detail,FIGS. 2B, 2C, and 2D are respective cross-sectional views taken alongline B-B′, line C-C′, and line D-D′ of FIG. 2A which is a plan view.

Referring to FIGS. 2A to 2D together, a portion of the substrate 110 isetched using the first mask pattern M1 (of FIGS. 1A to 1D) as an etchmask to form a shallow trench ST, and the plurality of preliminaryfin-shaped active regions PFA spaced apart from each other with theshallow trench ST therebetween are formed. In some example embodiments,a portion of the first mask pattern M1 may remain on an upper surface ofthe preliminary fin-shaped active regions PFA. The plurality ofpreliminary fin-shaped active regions PFA may be spaced apart from eachother by the first pitch PiN or the second pitch PiW. Since anarrangement of the plurality of preliminary fin-shaped active regionsPFA is substantially the same as that of the plurality of first maskpatterns M1, a detailed description thereof will not be given herein.

The preliminary fin-shaped active regions PFA may have a shapeprotruding in a third direction (Z direction) from the device region RXof the substrate 110. In some example embodiments, the preliminaryfin-shaped active regions PFA may have a shape in which a width of anupper portion is slightly tapered relative to a width of a lowerportion.

The plurality of preliminary fin-shaped active regions PFA may include areal fin-shaped active region RFA, a dummy fin-shaped active region DFA,a first curved fin-shaped active region CFAa, and a second curvedfin-shaped active region CFAb.

The real fin-shaped active region RFA and the dummy fin-shaped activeregion DFA may correspond to the first mask pattern M1 in which all ofthe portions of the plurality of preliminary fin-shaped active regionsPFA described in FIGS. 1A to 1D extend in the second direction (Ydirection). An upper surface of the real fin-shaped active region RFAmay be covered by a second mask pattern M2 described later below withreference to FIGS. 3A to 3D and an upper surface of the dummy fin-shapedactive region DFA may not be covered by the second mask pattern M2.

The first curved fin-shaped active region CFAa and the second curvedfin-shaped active region CFAb may correspond to the first curve maskpattern M1 a (of FIG. 1A) and the second curve mask pattern M1 b (ofFIG. 1A), respectively.

The first curved fin-shaped active region CFAa may include a first realfin-shaped extension unit/portion RFAa1, a second real fin-shapedextension unit/portion RFAa2, a dummy fin-shaped bypass extensionunit/portion DFDa, and a first fin-shaped refraction unit/portion DFBa.The first real fin-shaped extension unit/portion RFAa1, the second realfin-shaped extension unit/portion RFAa2, the dummy fin-shaped bypassextension unit/portion DFDa, and the first fin-shaped refractionunit/portion DFBa may correspond to the first main extensionunit/portion MMa1 (of FIG. 1A), the second main extension unit/portionMMa2 (of FIG. 1A), the mask bypass extension unit/portion MDa (of FIG.1A), and the first mask refraction units/portions MBa (of FIG. 1A) inthe first curved fin-shaped active region CFAa, respectively.

An upper surface of the first real fin-shaped extension unit/portionRFAa1 and the second real fin-shaped extension unit/portion RFAa2 in thefirst curved fin-shaped active region CFAa may be covered by the secondmask pattern M2 described later below with reference to FIGS. 3A to 3Dand an upper surface of the dummy fin-shaped bypass extensionunit/portion DFDa and the first fin-shaped refraction unit/portion DFBamay not be covered by the second mask pattern M2.

The second curved fin-shaped active region CFAb may include a third realfin-shaped extension unit/portion RFAb, a dummy fin-shaped extensionunit/portion DFAb, and a second fin-shaped refraction unit/portion DFBb.The third real fin-shaped extension RFAb, the dummy fin-shaped extensionDFAb, and the second fin-shaped refraction unit/portion DFBb maycorrespond to the third main extension unit/portion MMb1 (of FIG. 1A),the fourth main extension unit/portion MMb2 (of FIG. 1A), and the secondmask refraction unit/portion MBb (of FIG. 1A) in the second curvedfin-shaped active region CFAb, respectively.

An upper surface of the third real fin-shaped extension unit/portionRFAb in the second curved fin-shaped active region CFAb may be coveredby the second mask pattern M2 described later below with reference toFIGS. 3A to 3D and an upper surface of the dummy fin-shaped extensionunit/portion DFAb and the second fin-shaped refraction unit/portion DFBbmay not be covered by the second mask pattern M2.

FIGS. 3A to 3D are a plan view and cross-sectional views illustrating amethod of manufacturing a semiconductor device, according to someexample embodiments of the present inventive concepts. In more detail,FIGS. 3B, 3C, and 3D are respective cross-sectional views taken alongline B-B′, line C-C′, and line D-D′ of FIG. 3A which is a plan view.

Referring to FIG. 3A, after a mold layer 150 filling the shallow trenchST is formed, the second mask pattern M2 is formed on the mold layer150. In some example embodiments, the mold layer 150 may fill theshallow trench ST and cover the upper surface of the preliminaryfin-shaped active regions PFA. The second mask pattern M2 may include asilicon nitride layer, a silicon oxynitride layer, an SOG layer, an SOHlayer, a photoresist layer, or a combination thereof, but is not limitedthereto.

The second mask pattern M2 may be on (e.g., may cover) an upper surfaceof a first portion of the preliminary fin-shaped active regions PFA andmay not cover an upper surface of a remaining/second portion of thepreliminary fin-shaped active regions PFA.

As described with reference to FIGS. 2A to 2D, the second mask patternM2 may be formed to overlap the real fin-shaped active region RFA, thefirst real fin-shaped extension unit/portion RFAa1, the second realfin-shaped extension unit/portion RFAa2, and the third real fin-shapedextension unit/portion RFAb in the third direction (Z direction) so asto cover the upper surface of the real fin-shaped active region RFA, thefirst real fin-shaped extension unit/portion RFAa1, the second realfin-shaped extension unit/portion RFAa2, and the third real fin-shapedextension unit/portion RFAb.

The second mask pattern M2 may be formed not to overlap the dummyfin-shaped active region DFA, the dummy fin-shaped bypass extensionunit/portion DFDa, the first fin-shaped refraction unit/portion DFBa,the dummy fin-shaped extension unit/portion DFAb, and the secondfin-shaped refraction unit/portion DFBb in the third direction (Zdirection) so as not to cover the upper surface of the dummy fin-shapedactive region DFA, the dummy fin-shaped bypass extension unit/portionDFDa, the first fin-shaped refraction unit/portion DFBa, the dummyfin-shaped extension unit/portion DFAb, and the second fin-shapedrefraction unit/portion DFBb.

That is, portions of the preliminary fin-shaped active regions PFAcovered by the second mask pattern M2 are referred to as the realfin-shaped active region RFA, the first real fin-shaped extensionunit/portion RFAa1, the second real fin-shaped extension unit/portionRFAa2, and the third real fin-shaped extension unit/portion RFAb.Portions of the preliminary fin-shaped active regions PFA not covered bythe second mask pattern M2 are referred to as the dummy fin-shapedactive region DFA, the dummy fin-shaped bypass extension unit/portionDFDa, the first fin-shaped refraction unit/portion DFBa, the dummyfin-shaped extension unit/portion DFAb, and the second fin-shapedrefraction unit/portion DFBb.

In some example embodiments, the second mask pattern M2 may be on (e.g.,may cover) a first portion of the first fin-shaped refractionunit/portion DFBa and the second fin-shaped refraction unit/portionDFBb, and may not cover a remaining/second portion of the firstfin-shaped refraction unit/portion DFBa and the second fin-shapedrefraction unit/portion DFBb.

A first sidewall SW1 from among sidewalls of the second mask pattern M2,which extends in the second direction (Y direction) and faces the firstdirection (X direction), may be on the shallow trench ST between twoadjacent preliminary fin-shaped active regions PFA. A second sidewallSW2 from among sidewalls of the second mask pattern M2, which extends inthe first direction (X direction) and faces the second direction (Ydirection), may be located to traverse at least one of the preliminaryfin-shaped active regions PFA.

An interval of the two adjacent preliminary fin-shaped active regionsPFA with the first sidewall SW1 of the second mask pattern M2therebetween may be the second pitch PiW. When the second mask patternM2 covers or does not cover the entire shallow trench ST between the twoadjacent preliminary fin-shaped active regions PFA, an interval betweenthe two adjacent preliminary fin-shaped active regions PFA without thefirst sidewall SW1 of the second mask pattern M2 therebetween may beequal to the first pitch PiN. That is, the second pitch PiW, which isthe interval of the two adjacent preliminary fin-shaped active regionsPFA with the first sidewall SW1 of the second mask pattern M2therebetween, may have a value larger than the first pitch PiN, which isthe interval of the two adjacent preliminary fin-shaped active regionsPFA without the first sidewall SW1 of the second mask pattern M2therebetween.

Accordingly, when a portion of the plurality of preliminary fin-shapedactive regions PFA is etched and removed by using the second maskpattern M2 as an etching mask, the interval of the two adjacentpreliminary fin-shaped active regions PFA with the first sidewall SW1 ofthe second mask pattern M2 therebetween has the second pitch PiW, whichis a relatively large value. Therefore, it may be possible to secure asufficient etching process margin which can inhibit/prevent a portion ofthe preliminary fin-shaped active regions PFA, which is desired not tobe removed, from being removed, or a portion of the preliminaryfin-shaped active regions PFA, which is desired to be removed, fromremaining.

FIGS. 4A to 4D are a plan view and cross-sectional views illustrating amethod of manufacturing a semiconductor device, according to someexample embodiments of the present inventive concepts. In more detail,FIGS. 4B, 4C, and 4D are respective cross-sectional views taken alongline B-B′, line C-C′, and line D-D′ of FIG. 4A which is a plan view.

Referring to FIGS. 4A to 4D together, a portion of the plurality ofpreliminary fin-shaped active regions PFA (of FIGS. 3A to 3D) and aportion of the device region RX are removed by using the second maskpattern M2 (of FIGS. 3A to 3D) as an etching mask to form a deep trenchDT for separating a fin-shaped active region FA and the device regionRX. Thereafter, the mold layer 150 (of FIGS. 3A to 3D) may be removed.In some example embodiments, a portion of the mold layer 150 may remainto be a portion or all of a first isolation layer 122 described in FIGS.5A to 5D later below.

The device region RX may be a portion protruding from a lower surface ofthe deep trench DT of the substrate 110. Thus, a plurality of deviceregions RX may be spaced apart from each other with the deep trench DTtherebetween. A portion of the substrate 110 other than the deviceregions RX, that is, a lower portion with respect to the lower surfaceof the deep trench DT, may be referred to as a substrate base portion.Thus, the substrate 110 may include the substrate base portion and theplurality of device regions RX that are arranged on the substrate baseportion and spaced apart from each other.

Referring to FIGS. 4A to 4D together with FIGS. 3A to 3D, a portion ofthe preliminary fin-shaped active regions PFA covered by the second maskpattern M2 may be the fin-shaped active region FA. In more detail, thefirst real fin-shaped extension unit/portion RFAa1, the second realfin-shaped extension unit/portion RFAa2, and the third real fin-shapedextension unit/portion RFAb may be a first fin-shaped extensionunit/portion FAa1, a second fin-shaped extension unit/portion FAa2, anda third fin-shaped extension unit/portion FAb, respectively. Also, thereal fin-shaped active region RFA may be the fin-shaped active region FA“extending in the second direction (Y direction)”. The fin-shaped activeregion FA “extending in the second direction (Y direction)” from amongthe fin-shaped active regions FA may be referred to as a straightfin-shaped active region.

A portion of the preliminary fin-shaped active regions PFA that is notcovered by the second mask pattern M2 may be mostly removed and a partthereof may remain on the substrate 110 to be a protruding pattern PP.In more detail, the dummy fin-shaped bypass extension unit/portion DFDa,the first fin-shaped refraction unit/portion DFBa, the dummy fin-shapedextension unit/portion DFAb, and the second fin-shaped refractionunit/portion DFBb may be a protruding bypass extension unit/portion PDa,a first protruding refraction unit/portion PBa, a protruding extensionunit/portion PLb, and a second protruding refraction pattern PBb,respectively. Also, the dummy fin-shaped active region DFA may be theprotruding pattern PP “extending in the second direction (Y direction)”.The protruding pattern PP “extending in the second direction (Ydirection)” from among a plurality of protruding patterns PP may bereferred to as a straight protruding pattern.

The first fin-shaped extension unit/portion FAa1 and the secondfin-shaped extension unit/portion FAa2 are located on one straight line(i.e., are collinear) extending in the second direction (Y direction)and may be spaced apart from each other. The protruding bypass extensionunit/portion PDa and the first protruding refraction unit/portion PBabetween the first fin-shaped extension unit/portion FAa1 and the secondfin-shaped extension unit/portion FAa2 may be collectively referred toas a first curved protruding pattern PPa, and a second protrudingrefraction unit/portion PBb and the protruding extension unit/portionPLb adjacent to the third fin-shaped extension unit/portion FAb may becollectively referred to as the second curved protruding pattern PPb.One of first protruding refraction units/portions PBa, the protrudingbypass extension unit/portion PDa, and the other first protrudingrefraction unit/portion PBa may be sequentially connected to provide thefirst curved protruding pattern PPa. The second protruding refractionunit/portion PBb and the protruding extension unit/portion PLb may besequentially connected to provide the second curved protruding patternPPb.

Referring again to FIGS. 4A and 4B together, portions of fin-shapedactive regions FA adjacent to each other in the first direction (Xdirection) may have an interval of the second pitch PiW in the deviceregion RX, and portions of the protruding patterns PP adjacent to eachother in the first direction (X direction) may have an interval of thesecond pitch PiW in the device region RX. Further, portions of twofin-shaped active regions FA adjacent to each other in the firstdirection (X direction) may have an interval of the first pitch PiN.Portions of two protruding patterns PP adjacent to each other in thefirst direction (X direction) may have an interval of the first pitchPiN. As used herein, the term “pitch” refers to a distance between apoint on one element and the corresponding point on an adjacent element.For example, the first pitch PiN may be a distance between the midpointof a first fin-shaped active region FA and the midpoint of an adjacent(i.e., nearest) second fin-shaped active region FA. As another example,the second pitch PiW may be a distance between the midpoint of afin-shaped active region FA and the midpoint of an adjacent (i.e.,nearest) protruding pattern PP.

The third fin-shaped extension unit/portion FAb may have the intervalsbetween the first pitch PiN and a portion of the fin-shaped activeregions FA and between the second pitch PiW and another portion of thefin-shaped active regions FA, the portions of the fin-shaped activeregions FA respectively being adjacent to both sides of the thirdfin-shaped extension unit/portion FAb. In more detail, the thirdfin-shaped extension unit/portion FAb may have the interval of thesecond pitch PiW from a portion of the fin-shaped active regions FAarranged in a protruding direction of the second curved protrudingpattern PPb connected to the third fin-shaped extension unit/portion FAbon a plane arrangement. The third fin-shaped extension unit/portion FAbmay have the interval of the first pitch PiN from a portion of thefin-shaped active regions FA arranged in a direction opposite theprotruding direction of the second curved protruding pattern PPb.

In more detail, portions of the fin-shaped active regions FA adjacent tothe protruding bypass extension unit/portion PDa and the protrudingbypass extension unit/portion PDa may have the interval of the secondpitch PiW. Similarly, portions of the fin-shaped active regions FAadjacent to the protruding extension unit/portion PLb and the protrudingextension unit/portion PLb may have the interval of the second pitchPiW. Portions of the protruding patterns PP adjacent to the protrudingbypass extension unit/portion PDa and the protruding bypass extensionunit/portion PDa may have the interval of the first pitch PiN.Similarly, portions of the protruding patterns PP adjacent to theprotruding extension unit/portion PLb and the protruding extensionunit/portion PLb may have the interval of the first pitch PiN.

In the specification, the connection on a plane arrangement means thatthe second curved protruding pattern PPb and the third fin-shapedextension unit/portion FAb are arranged as if they are connected andextended to each other on the plane arrangement even though they are notactually connected to each other because positions thereof in a verticaldirection, i.e., the third direction (Z direction), are different fromeach other. Also, even when the second curved protruding pattern PPb andthe third fin-shaped extension unit/portion FAb have an interval on theplane arrangement due to process variation occurring in a manufacturingprocess, they can be considered to be connected to each other on theplane arrangement if they are arranged on a line extending generally inthe second direction (Y direction).

The protruding pattern PP may extend along a bottom surface of the deeptrench DT from a lower end of a third sidewall SW3 of the device regionRX to the other/opposite lower end of the third sidewall SW3 of thedevice region RX. That is, both ends of the protruding pattern PP may bein contact with lower ends of the third sidewall SW3 of the deviceregion RX, respectively.

One end of the fin-shaped active region FA may have a fourth sidewallSW4 which is a sidewall extending from the third sidewall SW3 of thedevice region RX. The one end of the fin-shaped active region FA may belocated on the lower end of the third sidewall SW3 of the device regionRX where one end of the protruding pattern PP contacts.

The protruding pattern PP may extend along the bottom surface of thedeep trench DT from the fourth sidewall SW4 of the fin-shaped activeregion FA to the lower end of the third sidewall SW3 of the deviceregion RX.

In some example embodiments, when the third sidewall SW3 of the deviceregion RX and the fourth sidewall SW4 of the fin-shaped active region FAextending therefrom are sloped, as described above, a portion of theprotruding pattern PP on a line extending in the second direction (Ydirection) and a portion of the fin-shaped active region FA may beseparated from each other by a small interval in a plane arrangement.

Each of the third sidewall SW3 and the fourth sidewall SW4 may be asidewall in the second direction (Y direction) from among the sidewallof the device region RX and the sidewall of the fin-shaped active regionFA.

The first curved protruding pattern PPa may extend along the bottomsurface of the deep trench DT from the lower end of the third sidewallSW3 of the device region RX, in which the first fin-shaped extensionunit/portion FAa1 is arranged, to the other lower end of the thirdsidewall SW3 of the device region RX, in which the second fin-shapedextended portion FAa2 is arranged, between the first fin-shapedextension unit/portion FAa1 and the second fin-shaped extensionunit/portion FAa2. The first curved protruding pattern PPa may have aportion extending in a direction different from the second direction (Ydirection). In some example embodiments, the first protruding refractionunit/portion PBa may extend in a direction different from the seconddirection (Y direction), and the protruding bypass extensionunit/portion PDa may extend in the second direction (Y direction).

Both ends of the first curved protruding pattern PPa may be on the lowerend of the third sidewall SW3 of the device region RX which is locatedon one straight line including the first fin-shaped extensionunit/portion FAa1 and the second fin-shaped extension unit/portion FAa2and extending in the second direction (Y direction).

The second curved protruding pattern PPb may extend in the seconddirection (Y direction) from the lower end of the third sidewall SW3 ofthe device region RX, in which third fin-shaped extension unit/portionFAb is arranged, to the bottom surface of the deep trench DT.

The second curved protruding pattern PPb may have a portion extending ina direction different from the second direction (Y direction). In someexample embodiments, the second protruding refraction unit/portion PBbmay extend in a direction different from the second direction (Ydirection), and the protruding extension unit/portion PLb may extend inthe second direction (Y direction).

FIGS. 5A to 5D are a plan view and cross-sectional views illustrating amethod of manufacturing a semiconductor device, according to someexample embodiments of the present inventive concepts. In more detail,FIGS. 5B, 5C, and 5D are respective cross-sectional views taken alongline B-B′, line C-C′, and line D-D′ of FIG. 5A which is a plan view.

Referring to FIGS. 5A to 5D together, an isolation layer 120 including afirst isolation layer 122 and a second isolation layer 124 respectivelyfilling lower portions of the shallow trench ST and the deep trench DTis formed. The isolation layer 120 may cover a lower sidewall of thefin-shaped active region FA.

The isolation layer 120 may include a silicon-containing insulating filmsuch as a silicon oxide layer, a silicon nitride layer, a siliconoxynitride layer, a silicon carbide nitride layer, and the like,polysilicon, or a combination thereof. The isolation layer 120 may beformed by plasma enhanced chemical vapor deposition (PECVD), highdensity plasma (HDP) CVD, inductively coupled plasma (ICP) CVD,capacitor coupled plasma (CCP) CVD, flowable CVD (FCVD), and/or a spincoating process. However, the present inventive concepts are not limitedthereto.

The isolation layer 120 is formed to cover both the upper surface andthe sidewall of the fin-shaped active region FA and then is partiallyremoved to reduce/lower an upper surface of the isolation layer 120. Forexample, the isolation layer 120 may be formed by performing a recessprocess to expose the upper surface and an upper sidewall of thefin-shaped active region FA. Dry etching, wet etching, or a combinationof dry etching and wet etching may be used to perform the recessprocess.

For the recess process of the isolation layer 120, a wet etching processusing NH₄OH, tetramethyl ammonium hydroxide (TMAH), potassium hydroxide(KOH) solution, or the like as an etchant, or a dry etching process suchas an inductively coupled plasma (ICP), transformer coupled plasma(TCP), electron cyclotron resonance (ECR), reactive ion etch (RIE), orthe like may be used. When the recess process of the isolation layer 120is performed by dry etching, a fluorine-containing gas such as CF₄ orthe like, or a chlorine-containing gas such as Cl₂, HBr or the like maybe used, but the present inventive concepts are not limited thereto.

In some example embodiments, the isolation layer 120 may have acomposite film structure. For example, the isolation layer 120 mayinclude first and second liners sequentially stacked on an inner wall ofeach of the shallow trench ST and the deep trench DT, and a gap-fillinsulating layer formed on the second liner. The first liner mayinclude, e.g., an oxide such as a silicon oxide, the second liner mayinclude, e.g., polysilicon or a nitride such as a silicon nitride, andthe gap-fill insulating layer may include, e.g., an oxide such as asilicon oxide.

In some example embodiments, the first isolation layer 122 and thesecond isolation layer 124 are formed together and may include anidentical material. In some example embodiments, a first portion of thesecond isolation layer 124 may be formed with the first isolation layer122, and a remaining/second portion of the second isolation layer 124may be formed separately from the first isolation layer 122. In someexample embodiments, the first isolation layer 122 and the secondisolation layer 124 may be formed separately.

The isolation layer 120 may cover the lower sidewall of the fin-shapedactive region FA and not cover the upper sidewall of the fin-shapedactive region FA. The upper sidewall of the fin-shaped active region FAthat is not covered by the isolation layer 120 may be a channel region.The protruding pattern PP may be covered with the isolation layer 120.

The third sidewall SW3 of the device region RX may be covered with theisolation layer 120. A lower portion of the fourth sidewall SW4 of thefin-shaped active region FA may be covered by the isolation layer 120and an upper portion of the same may not be covered by the isolationlayer 120.

In some example embodiments, an upper edge of the fin-shaped activeregion FA is partially removed so that an upper end of the fin-shapedactive region FA may have a rounded shape. In some example embodiments,a width of a portion of the fin-shaped active region FA exposed on/bythe upper surface of the isolation layer 120 in the fin-shaped activeregion FA may be narrower than the fin-shaped active regions FA shown inFIGS. 4B and 4C. Also, the upper end of the fin-shaped active region FAmay have a rounded shape.

In some example embodiments, an impurity ion implantation process forthreshold voltage adjustment may be performed on an upper portion of thefin-shaped active region FA. During the impurity ion implantationprocess for threshold voltage adjustment, boron (B) ions may beimplanted as an impurity when an n-channel metal-oxide-semiconductor(NMOS) transistor is formed, and phosphorus (P) or arsenic (As) may beimplanted as an impurity when a p-channel metal-oxide-semiconductor(PMOS) transistor is formed.

FIGS. 6A to 6D are a plan view and cross-sectional views of aconfiguration of a semiconductor device, according to some exampleembodiments of the present inventive concepts. In more detail, FIGS. 6B,6C, and 6D are respective cross-sectional views taken along line B-B′,line C-C′, and line D-D′ of FIG. 6A which is a plan view.

Referring to FIGS. 6A to 6D together, a plurality of gate structures 200extend across the fin-shaped active region FA and in the first direction(X direction). An extending direction (X direction) of a gate structure200 and an extending direction (Y direction) of the fin-shaped activeregion FA may be orthogonal to each other.

The gate structure 200 includes a gate dielectric layer 210, a gateconductive layer 220, and a gate capping layer 240, which aresequentially formed on a surface of the fin-shaped active region FA.Insulating spacers 230 may be formed on both sides of the gate structure200.

The gate dielectric layer 210 may cover an upper surface and bothsidewalls of the fin-shaped active region FA. The gate conductive layer220 may cover the gate dielectric layer 210 on the upper surface andboth sidewalls of the fin-shaped active region FA. The gate conductivelayer 220 may extend in the first direction (X direction). An extendingdirection (X direction) of the gate conductive layer 220 and theextending direction (Y direction) of the fin-shaped active region FA maybe orthogonal to each other.

The gate dielectric layer 210 may include a silicon oxide, a siliconnitride, a silicon oxynitride, a gallium oxide, a germanium oxide, ahigh-k dielectric material, or a combination thereof.

The gate dielectric layer 210 may include an interface layer 212 havinga first specific dielectric constant and a high (e.g., high-k)dielectric layer 214 formed on the interface layer 212 and having asecond specific dielectric constant higher than the first specificdielectric constant. The interface layer 212 may be formed on an uppersurface of the fin-shaped active regions FA and between portions of bothsidewalls of the gate conductive layer 220 that are not covered by theisolation layer 120 and a bottom surface of the gate conductive layer220 to face the bottom surface of the gate conductive layer 220, and thehigh dielectric layer 214 may face the bottom surface and the bothsidewalls of the gate conductive layer 220.

The interface layer 212 may include, but is not limited to, a low-kmaterial having a specific dielectric constant of 9 or less, such as asilicon oxide, a silicon nitride, a silicon oxynitride, a gallium oxide,or a germanium oxide. The interface layer 212 may be an oxide, anitride, or an oxynitride forming the substrate 110. The interface layer212 may have a thickness of, e.g., about 5 Å to about 20 Å, but is notlimited thereto. The interface layer 212 may be formed by thermaloxidation, atomic layer deposition (ALD), chemical vapor deposition(CVD), or physical vapor deposition (PVD).

The high dielectric layer 214 may include a high-k material having aspecific dielectric constant of about 10 to about 25 that is larger thanthat of the interface layer 212. The high dielectric layer 214 mayinclude, e.g., a material having a specific dielectric constant largerthan those of a silicon oxide layer and a silicon nitride layer. Thehigh dielectric layer 214 may include a material selected from hafniumoxide, hafnium oxynitride, hafnium silicon oxide, lanthanum oxide,lanthanum aluminum oxide, zirconium oxide, zirconium silicon oxide,tantalum oxide, titanium oxide, barium strontium titanium oxide, bariumtitanium oxide, strontium titanium oxide, yttrium oxide, erbium oxide,dysprosium oxide, gadolinium oxide, aluminum oxide, lead scandiumtantalum oxide, lead zinc niobate, and a combination thereof, but is notlimited thereto. The high dielectric layer 214 may be formed by ALD,CVD, or PVD. The high dielectric layer 214 may have a thickness of,e.g., about 10 Å to about 40 Å, but is not limited thereto.

In some example embodiments, the interface layer 212 may be formed onlybetween the upper surface of the fin-shaped active regions FA exposed bya thermal oxidation process and the gate conductive layer 220, but isnot limited thereto. For example, when the interface layer 212 is formedby thermal oxidation, ALD, CVD, or PVD, the interface layer 212 maycover a lower surface of the gate conductive layer 220, completely.

The gate conductive layer 220 may include, e.g., at least one metalselected from titanium (Ti), tantalum (Ta), aluminum (Al), tungsten (W),ruthenium (Ru), niobium (Nb), molybdenum (Mo), hafnium (Hf), nickel(Ni), cobalt (Co), platinum (Pt), ytterbium (Yb), terbium (Tb),dysprosium (Dy), erbium (Er), and palladium (Pd), a metal nitrideincluding at least one metal, and a metal compound such as acarbon-doped metal or a carbon-doped metal nitride.

The gate conductive layer 220 may be a single layer or a multilayerincluding a plurality of films. The gate conductive layer 220 mayinclude a metal-containing layer for work function adjustment and ametal-containing layer for filling a gap formed in an upper portion ofthe metal-containing layer for work function adjustment.

In some example embodiments, the gate conductive layer 220 may have astructure in which a metal nitride layer, a metal layer, a conductivecapping layer, and a gap-fill metal layer are sequentially stacked. Themetal nitride layer and the metal layer may each include at least onemetal atom selected from Ti, W, Ru, Nb, Mo, Hf, Ni, Co, Pt, Yb, Tb, Dy,Er, and Pd. The metal nitride layer and the metal layer may be formed bythe ALD process, a metal organic ALD (MOALD) process, or a metal organicCVD (MOCVD) process. The conductive capping layer may act as aprotective layer for inhibiting/preventing oxidation of a surface of themetal layer. In addition, the conductive capping layer may act as awetting layer for making a deposition of another conductive layer on themetal layer easier. The conductive capping layer may include a metalnitride layer, e.g., titanium nitride (TiN), tantalum nitride (TaN), ora combination thereof, but is not limited thereto. The gap-fill metallayer may extend on the conductive capping layer. The gap-fill metallayer may include a W layer. The gap-fill metal layer may be formed bythe ALD, the CVD, or the PVD process. The gap-fill metal layer may embeda recess space formed by a step between areas on an upper surface of theconductive capping layer without a void. In some example embodiments,the gate conductive layer 220 may include a stack structure ofTiAlC/TiN/W, a stack structure of TiN/TaN/TiAlC/TiN/W, or a stackstructure of TiN/TaN/TiN/TiAlC/TiN/W. In the above stack structures, theTiAlC layer or the TiN layer may function as a layer containing metalfor adjusting the work function.

In some example embodiments, the gate dielectric layer 210 and the gateconductive layer 220 may be formed by first forming a dummy gate layerand the insulating spacers 230 and then filling a gap between theinsulating spacers 230 from which a dummy gate is removed.

A pair of impurity regions 250 may be formed on both/opposite sides ofthe gate conductive layer 220 in the fin-shaped active region FA. Insome example embodiments, the pair of impurity regions 250 may be formedby implanting impurities into portions of the fin-shaped active regionFA exposed on the both sides of the gate structure 200. In some exampleembodiments, the pair of impurity regions 250 may be a semiconductorlayer that is epitaxially grown from the fin-shaped active region FAafter removing the portions of the fin-shaped active region FA exposedon the both sides of the gate structure 200. The pair of impurityregions 250 may be/include a source region and a drain region.

An impurity region 250 may include a material having a lattice constantlarger than that of the fin-shaped active region FA. The impurity region250 may include a different group of compound semiconductor materials,respectively. For example, the impurity region 250 may include a groupIII-V compound semiconductor material or a group II-VI compoundsemiconductor material.

In some example embodiments, at least a portion of the impurity region250 may include a crystalline group III-V compound semiconductormaterial having a lattice constant larger than that of silicon by 7.5%or more, or a crystalline group II-VI compound semiconductor material.For example, at least a portion of the impurity region 250 may include agroup III-V compound semiconductor material such as GaSb, AlSb, and InP,or a group II-VI compound semiconductor material such as CdSe, MgSe,ZnTe, MgTe, and GdTe. GaSb, AlSb, InP, CdSe, MgSe, ZnTe, MgTe, and CdTemay have lattice constants of 6.096 Å, 6.136 Å, 5.869 Å 6.05 Å, 5.873 Å,6.101 Å, 6.417 Å and 6.48 Å, respectively.

In some example embodiments, a portion of the impurity region 250 mayinclude an amorphous group III-V compound semiconductor material or anamorphous group II-VI family compound semiconductor material. Forexample, at least a portion of the impurity region 250 may include anamorphous layer of a group III-V compound semiconductor material such asGaSb, AlSb, and InP, or an amorphous layer of a group II-VI compoundsemiconductor material such as CdSe, MgSe, ZnTe, MgTe, and GdTe.

In some example embodiments, the pair of impurity regions 250 mayprotrude upward from the upper surface of the fin-shaped active regionsFA.

An insulating spacer 230 may include, e.g., a silicon nitride layer, asilicon oxynitride layer, a carbon-containing silicon oxynitride layer,or a composite layer thereof, or may have an air gap or a low dielectriclayer therein. The gate capping layer 240 may include, e.g., a siliconnitride layer.

An interlayer insulating layer 300 may be formed on (e.g. to cover) theinsulating spacers 230 on the opposite side of the gate structure 200with respect to the insulating spacers 230. The interlayer insulatinglayer 300 may include, e.g., a silicon oxide layer such astetra-ethyl-ortho-silicate (TEOS).

A transistor TR may be formed at a portion where the fin-shaped activeregion FA and the gate conductive layer 220 intersect with each other.The transistor TR includes a MOS transistor of a three-dimensional (3D)structure in which a channel is formed on an upper surface and bothsidewalls of the fin-shaped active region FA.

In some example embodiments, the semiconductor device 1 may furtherinclude a nanosheet stack structure facing the upper surface of thefin-shaped active regions FA at a position spaced apart from the uppersurface of the fin-shaped active regions FA. The nanosheet stackstructure may include a plurality of nanosheets extending parallel tothe upper surface of the fin-shaped active regions FA. The plurality ofnanosheets may include a channel region. A gate conductive layer 220 maysurround at least a portion of the channel region. The nanosheets mayinclude a group IV semiconductor, a group IV-IV compound semiconductor,or a group III-V compound semiconductor. For example, the nanosheets mayinclude Si, Ge, or SiGe, or may include InGaAs, InAs, GaSb, InSb, or acombination thereof. When the semiconductor device 1 further includes ananosheet stack structure, the gate dielectric layer 210 may beinterposed between the channel region and the gate conductive layer 220.The impurity region 250 may be in contact with both ends of theplurality of nanosheets and the both ends of the plurality of nanosheetsadjacent to the impurity region 250 may be covered with the insulatingspacers 230 covering the sidewalls of the gate conductive layer 220. Apair of inner insulating spacers may be formed between the fin-shapedactive region FA and the nanosheets. The pair of inner insulatingspacers may be interposed between the gate conductive layer 220 and theimpurity region 250. The inner insulating spacer may include a materialdifferent from that of the gate dielectric layer 210. The innerinsulating spacer may include a material having a dielectric constantless than that of the material constituting the gate dielectric layer210. For example, the inner insulating spacer may include, but is notlimited to, an oxide of a material constituting the nanosheets. The gatedielectric layer 210 may extend from a surface of the channel region ofthe nanosheets to the sidewall surface of the inner insulating spacer soas to be interposed between the gate conductive layer 220 and the innerinsulating spacer.

The semiconductor device 1 according to some example embodiments of thepresent inventive concepts may include the plurality of fin-shapedactive regions FA extending in the second direction (Y direction) andthe plurality of protruding patterns PP extending substantially in thesecond direction (Y direction).

Portions of the plurality of fin-shaped active regions FA, which areadjacent to each other, may be arranged with the first pitch PiN.Portions of the plurality of protruding patterns PP, which are adjacentto each other and extend in the second direction (Y direction), may bearranged with the first pitch PiN. Respective portions of the pluralityof fin-shaped active regions FA and the plurality of protruding patternsPP, which are adjacent to each other and extend in the second direction(Y direction), may be arranged with the second pitch PiW that is largerthan the first pitch PiN.

The protruding pattern PP is a portion remaining on the substrate 110 atthe bottom surface of the deep trench DT after a portion of thepreliminary fin-shaped active regions PFA (FIGS. 4A to 4D) is removed,so that respective portions of the plurality of fin-shaped activeregions FA and the plurality of protruding patterns PP, which areadjacent to each other and extend in the second direction (Y direction),are arranged with the first sidewall SW1 (of FIGS. 3A to 3D) of thesecond mask pattern M2 (of FIGS. 3A to 3D) therebetween. Since the firstsidewall SW1 of the second mask pattern M2 is located between portionsof the preliminary fin-shaped active regions PFA adjacent to each otherat the relatively large second pitch PiW, it may be possible to obtain asufficient etching process margin when forming the second mask patternM2 or performing an etching process for removing a portion of thepreliminary fin-shaped active regions PFA by using the second maskpattern M2 as an etching mask. Thus, it may be possible toinhibit/prevent the performance of the semiconductor device 1 fromdeteriorating or the semiconductor device 1 from including defects as aportion of the preliminary fin-shaped active regions PFA, which is notto be removed, is actually removed, or a portion of the preliminaryfin-shaped active regions PFA, which is to be removed, remains as is.

A semiconductor device according to the present inventive concepts maynot suffer from performance degradation or defects because a portion ofa preliminary fin-shaped active region for forming a fin-shaped activeregion, which is desired not to be removed, is not removed and a portiondesired to be removed does not remain.

Although the present inventive concepts have been particularly shown anddescribed with reference to example embodiments thereof, it will beunderstood by those of ordinary skill in the art that various changes inform and details may be made therein without departing from the spiritand scope of the present disclosure as defined by the following claims.

What is claimed is:
 1. A semiconductor device comprising: a substratecomprising a device region defined by a trench in the substrate; aplurality of fm-shaped active regions spaced apart from each other inthe device region and extending in a first direction; and a plurality ofprotruding patterns extending along a bottom surface of the trench, oneof the plurality of protruding patterns extending from a lower end of asidewall of the device region, wherein adjacent ones of the plurality offin-shaped active regions are spaced apart from each other at a firstpitch in a second direction perpendicular to the first direction,wherein the plurality of protruding patterns and the plurality offin-shaped active regions are spaced apart from each other at a secondpitch in the second direction, the second pitch being greater than thefirst pitch, wherein the lower end of the sidewall of the device regioncomprises a first lower end of a first sidewall of the device region,and wherein the one of the plurality of protruding patterns extends fromthe first lower end of the first sidewall to a second lower end of asecond sidewall of the device region.
 2. The semiconductor device ofclaim 1, wherein the plurality of fin-shaped active regions comprises afin sidewall extending upward from the sidewall of the device region. 3.The semiconductor device of claim 1, wherein the plurality of fin-shapedactive regions comprise a first fm-shaped extension portion and a secondfin-shaped extension portion that are spaced apart from each other andare collinear in the first direction, wherein the first lower end of thefirst sidewall is under a first fin sidewall of the first fin-shapedextension portion, wherein the second lower end of the second sidewallis under a second fin sidewall of the second fin-shaped extensionportion, and wherein the one of the plurality of protruding patternscomprises a curved protruding pattern comprising a first portionextending in a third direction different from the first direction. 4.The semiconductor device of claim 3, wherein a second portion of thecurved protruding pattern extends in the first direction and is notcollinear with the first fin-shaped extension portion and the secondfin-shaped extension portion, the first portion extending from thesecond portion to the first lower end of the first sidewall of thedevice region.
 5. The semiconductor device of claim 4, wherein the firstsidewall of the device region is aligned with the first fin sidewall ofthe first fin-shaped extension portion, and wherein the second sidewallof the device region is aligned with the second fin sidewall of thesecond fin-shaped extension portion.
 6. The semiconductor device ofclaim 5, wherein the plurality of fin-shaped active regions comprises astraight fin-shaped active region extending in the first direction inparallel with the first and second fin-shaped extension portions,wherein the straight fin-shaped active region is spaced apart from thefirst and second fin-shaped extension portions at the first pitch,wherein the plurality of protruding patterns comprises a straightprotruding pattern extending in the first direction in parallel with thefirst and second fin-shaped extension portions, and wherein the straightprotruding pattern is spaced apart from the first and second fin-shapedextension portions at the second pitch.
 7. The semiconductor device ofclaim 6, wherein the straight fin-shaped active region is spaced apartfrom the second portion at the second pitch, and wherein the straightprotruding pattern is spaced apart from the second portion at the firstpitch.
 8. The semiconductor device of claim 4, wherein an intervalbetween the second portion and an axis on which the first fin-shapedextension portion and the second fin-shaped extension portion arecollinear is equal to a difference between the second pitch and thefirst pitch.
 9. The semiconductor device of claim 1, further comprising:an isolation layer on lower portions of fin sidewalls of the pluralityof fin-shaped active regions, on the sidewall of the device region, andon the plurality of protruding patterns; and a plurality of gatestructures spaced apart from each other in the first direction andextending in the second direction on the isolation layer and on theplurality of fin-shaped active regions, each of the plurality of gatestructures comprising a gate dielectric layer and a gate conductivelayer.
 10. The semiconductor device of claim 1, wherein adjacent ones ofthe plurality of protruding patterns are spaced apart from each other atthe first pitch in the second direction.
 11. A semiconductor devicecomprising: a substrate comprising a device region defined by a trenchin the substrate; a plurality of fin-shaped active regions spaced apartfrom each other in the device region and extending in a first direction;and a plurality of protruding patterns extending along a bottom surfaceof the trench, wherein an interval between the plurality of protrudingpatterns and the plurality of fin-shaped active regions is greater thanan interval between two adjacent ones of the plurality of fin-shapedactive regions, and wherein first and second ends of one of theplurality of protruding patterns are in contact with first and secondlower ends of first and second sidewalls of the device region,respectively.
 12. The semiconductor device of claim 11, wherein twoadjacent ones of the plurality of protruding patterns are spaced apartfrom each other at a first pitch in a second direction perpendicular tothe first direction, and wherein the first pitch comprises the intervalbetween the two adjacent ones of the plurality of fin-shaped activeregions.
 13. The semiconductor device of claim 11, wherein a portion ofthe plurality of protruding patterns extends in a second directiondifferent from the first direction.
 14. The semiconductor device ofclaim 11, wherein a sidewall of one of the plurality of fin-shapedactive regions is on one of the first and second sidewalls of the deviceregion.
 15. A semiconductor device comprising: a substrate comprising adevice region defined by a trench in the substrate; a plurality offin-shaped active regions spaced apart from each other at a first pitchin the device region and extending in a first direction; a protrudingpattern extending along a bottom surface of the trench from a lower endof a sidewall of the device region; an isolation layer on lower portionsof fin sidewalls of the plurality of fin-shaped active regions, on thesidewall of the device region, and on the protruding pattern; and aplurality of gate structures spaced apart from each other in the firstdirection and extending in a second direction different from the firstdirection on the isolation layer and on the plurality of fin-shapedactive regions, wherein each of the plurality of gate structurescomprises a gate dielectric film and a gate conductive layerintersecting the plurality of fin-shaped active regions, wherein theprotruding pattern and the plurality of fin-shaped active regions arespaced apart from each other at a second pitch greater than the firstpitch in the second direction, and wherein a longitudinal dimension of afirst portion of the protruding pattern is in the first direction and alongitudinal dimension of a second portion of the protruding pattern isin a third direction oblique to the first direction and the seconddirection.
 16. The semiconductor device of claim 15, wherein one end ofthe protruding pattern is in contact with the lower end of the sidewallof the device region under one of the fin sidewalls of one of theplurality of fin-shaped active regions.
 17. The semiconductor device ofclaim 16, wherein the first portion of the protruding pattern is spacedapart in the second direction from an axis on which the one of theplurality of fin-shaped active regions extends in the first direction.18. The semiconductor device of claim 15, wherein one of the pluralityof gate structures extends across the protruding pattern.
 19. Thesemiconductor device of claim 15, wherein the protruding patterncomprises a curved protruding pattern, and wherein the semiconductordevice further comprises a straight protruding pattern extending alongthe bottom surface of the trench.